The International Scientific Laboratory for Optical Diagnostics (ISL LOD) is a joint center of excellence in research and application of optical and laser technology supported by the International Science and Technology Center, the Institute of Nondestructive Testing of the Fraunhofer Society of Germany, and the Stepanov Institute of Physics of the National Academy of Sciences of Belarus. Read a bit more...
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Research Areas
Femtosecond Technology
Scanning Near-Field Microscopy
Heterodyne Interferometery
Profilometry
Multiscope Diagnostic of Brain Tissue
Optical Detection of Trace Gases
Numerical Simulation

ISL LOD Partners
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Development Of Heterodyne And Speckle Interferometry Methods For Industrial Applications Print E-mail

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Objectives
  • Microstructure surface characterization, testing non-homogeneous distribution of optical characteristics of objects in transmitted and reflected light.
  • Measurement of diffuse objects.
  • Advanced methods for measurement of dynamic stress and vibration.
  • Detection of cracks. 
Principle

Heterodyne interferometry is based on the precise detection of the beat frequency between beams of two optical wavelengths. If one of two interfering waves is phase-shifted, the beat frequency undergoes the same amount of shift. Measuring it one extracts either the optical path difference or the phase anisotropy. The phase of the beat frequency signal can be measured with the accuracy better than 0.01 degree providing the most accurate interferometry technique available.

Advantages
  • Ultimate accuracy and sensitivity;
  • High noise immunity;
  • Easy data processing as the beat frequency lies in the radio range.
Applications

Crack detection in Si wafers
Study on electro- and magneto-optical effects in materials
Vibration detection
Capillary blood flow monitoring in vivo by speckle interferometry
Detecting characteristics of moving objects using speckle interferometry.

Contact

Dr. Valery Gudelev
Phone              +375 17 284 17 00
E- mail This email address is being protected from spam bots, you need Javascript enabled to view it  

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Application of near-IR heterodyne interferometry for crack detection in polycrystalline Si wafers used for solar cells manufacturing; a), b) – wafer images; c) phase anisotropy map demonstrateing the presence of microcracks of a 35-100 micron size.

 
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